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The trace element analyzer is based on Inductively Coupled Plasma Mass Spectrometry (ICP-MS) technology. It utilizes a high-frequency radio frequency (RF) signal to generate a high-temperature plasma that ionizes the analytes. The mass spectrometer then detects the ions' mass-to-charge ratio and intensity, enabling the quantification of elemental concentrations in the sample.
The working principle involves two main components:
Atomic Absorption Spectrophotometer
AAS Series Trace Element Analyzer
ICP-MS Trace Element Analyzer